FreeNAS log:
kernel: ad0: FAILURE - READ_DMA48 status=51 error=40 LBA=445600994
kernel: g_vfs_done():ad0p1[READ(offset=228147691520, length=16384)]error = 5
SMART output:
$ smartctl -a /dev/da0
smartctl version 5.38 [i386-portbld-freebsd7.2] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.9 family
Device Model: ST3250824A
Serial Number: 3ND0Y5G1
Firmware Version: 3.AAH
User Capacity: 250,059,350,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Wed Mar 3 15:30:28 2010 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 100) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 107 095 006 Pre-fail Always - 13692759
3 Spin_Up_Time 0x0003 092 088 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 342
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 075 060 030 Pre-fail Always - 38432019
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 767
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 364
187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 1812
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 060 056 045 Old_age Always - 40 (Lifetime Min/Max 33/40)
194 Temperature_Celsius 0x0022 040 044 000 Old_age Always - 40 (0 19 0 0)
195 Hardware_ECC_Recovered 0x001a 059 051 000 Old_age Always - 76090870
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 2
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 2
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1817 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1817 occurred at disk power-on lifetime: 767 hours (31 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e8 54 8f 40 Error: UNC at LBA = 0x008f54e8 = 9393384
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 e2 54 8f 40 00 03:27:10.863 READ DMA EXT
b0 d1 01 01 4f c2 e0 00 03:27:08.976 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
25 00 20 e2 54 8f 40 00 03:27:08.944 READ DMA EXT
b0 d0 00 00 4f c2 e0 00 03:27:07.057 SMART READ DATA
25 00 20 e2 54 8f 40 00 03:27:06.984 READ DMA EXT
Error 1816 occurred at disk power-on lifetime: 767 hours (31 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e8 54 8f 40 Error: UNC at LBA = 0x008f54e8 = 9393384
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 e2 54 8f 40 00 03:27:04.672 READ DMA EXT
b0 d0 00 00 4f c2 e0 00 03:27:08.976 SMART READ DATA
25 00 20 e2 54 8f 40 00 03:27:08.944 READ DMA EXT
b0 da 00 00 4f c2 e0 00 03:27:07.057 SMART RETURN STATUS
ca 00 0c 22 2f 00 e0 00 03:27:06.984 WRITE DMA
Error 1815 occurred at disk power-on lifetime: 767 hours (31 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e8 54 8f 40 Error: UNC at LBA = 0x008f54e8 = 9393384
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 e2 54 8f 40 00 03:27:04.672 READ DMA EXT
b0 da 00 00 4f c2 e0 00 03:27:04.672 SMART RETURN STATUS
ca 00 0c 22 2f 00 e0 00 03:27:04.672 WRITE DMA
ca 00 20 02 2f 00 e0 00 03:27:07.057 WRITE DMA
ca 00 04 a2 00 00 e0 00 03:27:06.984 WRITE DMA
Error 1814 occurred at disk power-on lifetime: 767 hours (31 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e8 54 8f 40 Error: UNC at LBA = 0x008f54e8 = 9393384
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 e2 54 8f 40 00 03:27:04.672 READ DMA EXT
35 00 20 22 19 34 40 00 03:27:04.672 WRITE DMA EXT
35 00 20 02 19 34 40 00 03:27:04.672 WRITE DMA EXT
35 00 20 e2 18 34 40 00 03:27:04.671 WRITE DMA EXT
35 00 20 c2 18 34 40 00 03:27:04.671 WRITE DMA EXT
Error 1813 occurred at disk power-on lifetime: 767 hours (31 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e8 54 8f 40 Error: UNC at LBA = 0x008f54e8 = 9393384
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 e2 54 8f 40 00 03:26:51.227 READ DMA EXT
25 00 20 e2 bc 40 40 00 03:26:51.227 READ DMA EXT
ec 00 00 00 00 00 e0 00 03:26:51.226 IDENTIFY DEVICE
25 00 20 e2 54 8f 40 00 03:26:51.226 READ DMA EXT
c8 00 20 62 55 1d e5 00 03:26:51.226 READ DMA
SMART Self-test log structure revision number 1
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
